New Superior Automation and Usability Options on the Oxford Devices Asylum Analysis Jupiter XR Massive-Pattern Atomic Pressure Microscope – Insta News Hub
Oxford Devices Asylum Analysis right this moment publicizes the discharge of recent options for the Jupiter XR atomic pressure microscope (AFM) to extend productiveness and enhance usability. The Jupiter AFM will now embody a side-view digicam that gives a direct high-resolution view of the AFM tip – pattern separation throughout instrument setup which dramatically improves usability and